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SSH ISO 22493:2014

Microbeam analysis — Scanning electron microscopy — Vocabulary

Nov 16, 2016

General information

60.60     Jul 12, 2016

DPS

DPS/KT 233

International Standard

37.020     01.040.37  

English  

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Scope

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

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PUBLISHED
SSH ISO 22493:2014
60.60 Standard published
Jul 12, 2016

Related project

Adopted from ISO 22493:2014