DPS
Drejtoria e Përgjithshme e Standardizimit
0 Items
My account
E-albania
Phone: +355 4 222 62 55
E-mail: info@dps.gov.al
Address: Address: "Reshit Collaku" Str., (nearby ILDKPKI, VI floor), Po.Box 98, Tiranë - Albania
Main menu

SSH ISO 22493:2014

Microbeam analysis — Scanning electron microscopy — Vocabulary

Nov 16, 2016

General information

60.60     Jul 12, 2016

DPS

DPS/KT 233

International Standard

37.020     01.040.37  

English  

Buying

Published

Language in which you want to receive the document.

Scope

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

Life cycle

NOW

PUBLISHED
SSH ISO 22493:2014
60.60 Standard published
Jul 12, 2016

Related project

Adopted from ISO 22493:2014

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to members of the committee. If you are a member, please log in to your account by clicking on the "Log in" button.

Login