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Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
40.60 Close of voting
Detail Specification: Fixed low power film resistors - Metal film resistors on high grade ceramic, conformal coated or molded, axial or preformed leads
40.60 Close of voting
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
40.60 Close of voting
Capacitors and resistors for use in electronic equipment - Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components
40.60 Close of voting
Capacitors and resistors for use in electronic equipment - Preferred dimensions of shaft ends, bushes and for the mounting of single-hole, bush-mounted, shaft-operated electronic components
40.60 Close of voting
Quartz crystal units of assessed quality - Part 2: Guidelines for the use
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Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
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Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
40.60 Close of voting
Semiconductor devices - Part 5-12: Optoelectronic devices - Light emitting diodes - Test method of LED efficiencies
40.60 Close of voting
Semiconductor devices - Part 5-8: Optoelectronic devices - Light emitting diodes - Test method of optoelectronic efficiencies of light emitting diodes
40.60 Close of voting
Semiconductor devices - Part 6: Discrete devices - Thyristors
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Amendment 1 - Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
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Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
60.55 Ratification completed (DOR)
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.60 Close of voting
Arc welding equipment - Part 1: Welding power sources
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Electrostatics - Part 4-11: Standard test methods for specific applications - Testing of electrostatic properties of composite IBC
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Electrostatics - Part 4-6: Standard test methods for specific applications - Wrist straps
40.60 Close of voting
Electrostatics - Part 4-7: Standard test methods for specific applications - Ionization
40.60 Close of voting