ISO 18114:2003

Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials

Publication date: 14 pri 2003

95.99 Withdrawal of Standard 11 maj 2021

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Current stage: 95.99 Effective date: 11 maj 2021

Originator: ISO

Owner: ISO/TC 201/SC 6

Type: International Standard

ICS: 71.040.40

Gjuha: anglisht

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Statusi: Shfuqizuar

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ISO 18114:2003 specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.
The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.

ISO 18114:2003

Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials

95.99 Withdrawal of Standard 11 maj 2021

General information

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