ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Publication date: 5 gush 1993

95.99 Withdrawal of Standard 15 korr 2003

General information

Current stage: 95.99 Effective date: 15 korr 2003

Originator: ISO

Owner: ISO/TC 171/SC 2

Type: International Standard

ICS: 37.080

Gjuha: frëngjisht anglisht

Buying

Statusi: Shfuqizuar

PDF - 7 576 Lekë

Paper - 7 576 Lekë

CD - 7 576 Lekë

Language

Language in which you want to receive the document.

Scope

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Life cycle

NOW

WITHDRAWN
ISO 6342:1993
95.99 Withdrawal of Standard
15 korr 2003

REVISED BY

PUBLISHED
ISO 6342:2003