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ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Aug 5, 1993
95.99 Withdrawal of Standard   Jul 15, 2003

General information

95.99     Jul 15, 2003

ISO

ISO/TC 171/SC 2

International Standard

37.080  

French   English  

Buying

Withdrawn

Language in which you want to receive the document.

Scope

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Life cycle

NOW

WITHDRAWN
ISO 6342:1993
95.99 Withdrawal of Standard
Jul 15, 2003

REVISED BY

PUBLISHED
ISO 6342:2003