ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area

Publication date: Jul 15, 2003

General information

Current stage: 90.20 Effective date: Jan 15, 2026

Originator: ISO

Owner: ISO/TC 171

Type: International Standard

ICS: 37.080

Languages: English

Buying

Status: Published

PDF - ALL 4,975

Paper - ALL 4,975

CD - ALL 4,975

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Scope

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 6342:1993

NOW

PUBLISHED
ISO 6342:2003
90.20 Standard under periodical review
Jan 15, 2026

National adoptions

SSH ISO 6342:2003

DPS

Micrographics — Aperture cards — Method of measuring thickness of buildup area

60.60 Standard published

DPS/KT 304 more

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