IEC 61649:1997 ED1

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

Publication date: 16 maj 1997

General information

Current stage: 99.60 Effective date: 13 gush 2008

Originator: IEC

Owner: TC 56

Type: International Standard

ICS: 03.120.01 03.120.30

Gjuha: anglisht frëngjisht spanjisht

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Statusi: Revised

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Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

IEC 61649:1997 ED1

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

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