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IEC 61649:1997 ED1

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

May 16, 1997

General information

99.60     Aug 13, 2008

IEC

TC 56

International Standard

03.120.01     03.120.30  

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Scope

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

Life cycle

NOW

WITHDRAWN
IEC 61649:1997 ED1
99.60 Withdrawal effective
Aug 13, 2008

REVISED BY

PUBLISHED
IEC 61649:2008 ED2