Publikuar
IEC 63011-1:2018 provides definitions pertaining to multichip integrated circuits, as vertically stacked dies using through-silicon vias (TSVs) or micro bumps. Terms and definitions related to the fabrication and test of the multichip integrated circuits are also provided.
PUBLISHED
IEC 63011-1:2018 ED1
60.60
Standard published
28 nën 2018
Qarqe të integruara - Qarqet e integruara tre përmasore - Pjesa 1: Terminologjia
60.60 Standard published