IEC 62951-3:2018 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

Publication date: 7 nën 2018

General information

Current stage: 60.60 Effective date: 7 nën 2018

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.99

Gjuha: anglisht

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Statusi: Publikuar

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Scope

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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PUBLISHED
IEC 62951-3:2018 ED1
60.60 Standard published
7 nën 2018

National adoptions

SSH IEC 62951-3:2018

DPS

Pajisje gjysmëpërçuese - Pajisje gjysmëpërçuese elastike dhe të tendosshme - Pjesa 3: Vlerësimi i karakteristikave të transistorit me fletë të holla mbi nënshtresat elastike nën fryrje

60.60 Standard published

DPS/KT 7 më tepër