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IEC 62951-3:2018 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

Nov 7, 2018

General information

60.60     Nov 7, 2018

IEC

TC 47

International Standard

31.080.99  

English  

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Scope

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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PUBLISHED
IEC 62951-3:2018 ED1
60.60 Standard published
Nov 7, 2018

National adoptions

SSH IEC 62951-3:2018  
DPS

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

60.60 Standard published

DPS/KT 7 more