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SSH IEC 62951-3:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

Apr 21, 2020

General information

60.60     Feb 12, 2020

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DPS/KT 7

Pure national standard

31.080.99  

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Scope

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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PUBLISHED
SSH IEC 62951-3:2018
60.60 Standard published
Feb 12, 2020

Related project

Adopted from IEC 62951-3:2018 ED1 IDENTICAL