IEC 60749-41:2020 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Publication date: 22 korr 2020

General information

Current stage: 60.60 Effective date: 22 korr 2020

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Publikuar

PDF - 17 526 Lekë

Paper - 17 526 Lekë

CD - 17 526 Lekë

Language

Language in which you want to receive the document.

Scope

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Life cycle

NOW

PUBLISHED
IEC 60749-41:2020 ED1
60.60 Standard published
22 korr 2020

National adoptions

SSH EN IEC 60749-41:2020

DPS

Pajisje gjysmëpërçuese - Metodat e provës mekanike dhe klimatike - Pjesa 41: Metodat e testimit standard të besueshmërisë të pajisjes me kujtesë të paqëndrueshme

60.60 Standard published

DPS/KT 7 më tepër