IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Publication date: 4 dhj 2015

General information

Current stage: 60.60 Effective date: 4 dhj 2015

Originator: IEC

Owner: TC 91

Type: Technical Report

ICS: 31.180 31.190

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

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Scope

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Life cycle

NOW

PUBLISHED
IEC TR 62878-2-2:2015 ED1
60.60 Standard published
4 dhj 2015