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IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Dec 4, 2015

General information

60.60     Dec 4, 2015

IEC

TC 91

Technical Report

31.180     31.190  

English   French  

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Scope

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

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PUBLISHED
IEC TR 62878-2-2:2015 ED1
60.60 Standard published
Dec 4, 2015