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prDS IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

General information

40.60     May 11, 2026

60.60   

DPS

DPS/KT 8

Technical Report

31.180     31.190  

Scope

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

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prDS IEC TR 62878-2-2:2015 ED1
40.60 Close of voting
May 11, 2026

Related project

Adopted from IEC TR 62878-2-2:2015 ED1 IDENTICAL