prDS IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

General information

Current stage: 40.20 Effective date: Feb 9, 2026

Next stage: 40.60 Next stage date: May 11, 2026

Originator: DPS

Owner: DPS/KT 8

Type: Technical Report

ICS: 31.180 31.190

Scope

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Life cycle

NOW

IN_DEVELOPMENT
prDS IEC TR 62878-2-2:2015 ED1
40.20 DIS ballot initiated: 12 weeks
Feb 9, 2026

Related project

Adopted from IEC TR 62878-2-2:2015 ED1 IDENTICAL

Preview

Only informative sections of projects are publicly available. To view the full content, you will need to create an account. If you are a member, please log in to your account by clicking on the "Log in" button.