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DS IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Oct 12, 2026

General information

60.60     Oct 12, 2026

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DPS/KT 8

Technical Report

31.180     31.190  

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IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

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DS IEC TR 62878-2-2:2015 ED1
60.60 Standard published
Oct 12, 2026

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Adopted from IEC TR 62878-2-2:2015 ED1 IDENTICAL