IEC 60749-27:2006 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publication date: 25 sht 2012

General information

Current stage: 60.60 Effective date: 18 korr 2006

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

PDF - 17 526 Lekë

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CD - 17 526 Lekë

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-27:2003 ED1

NOW

PUBLISHED
IEC 60749-27:2006 ED2
60.60 Standard published
18 korr 2006

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 60749-27:2006/AMD1:2012 ED2