IEC 60749-27:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Publication date: 21 tet 2003

General information

Current stage: 99.60 Effective date: 18 korr 2006

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Revised

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62180:2000 ED1

NOW

WITHDRAWN
IEC 60749-27:2003 ED1
99.60 Withdrawal effective
18 korr 2006

REVISED BY

PUBLISHED
IEC 60749-27:2006 ED2