IEC 60749-26:2006 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Publication date: 18 korr 2006

General information

Current stage: 99.60 Effective date: 23 pri 2013

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Revised

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Scope

Establishes a standard procedure for testing and classifying
semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-26:2003 ED1

NOW

WITHDRAWN
IEC 60749-26:2006 ED2
99.60 Withdrawal effective
23 pri 2013

REVISED BY

WITHDRAWN
IEC 60749-26:2013 ED3