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IEC 60749-26:2006 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Jul 18, 2006

General information

99.60     Apr 23, 2013

IEC

TC 47

International Standard

31.080.01  

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Revised

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Scope

Establishes a standard procedure for testing and classifying
semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749-26:2003 ED1

NOW

WITHDRAWN
IEC 60749-26:2006 ED2
99.60 Withdrawal effective
Apr 23, 2013

REVISED BY

WITHDRAWN
IEC 60749-26:2013 ED3