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IEC 60749-26:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

Oct 21, 2003

General information

99.60     Jul 18, 2006

IEC

TC 47

International Standard

31.080.01  

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Revised

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Scope

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62179:2000 ED1

NOW

WITHDRAWN
IEC 60749-26:2003 ED1
99.60 Withdrawal effective
Jul 18, 2006

REVISED BY

WITHDRAWN
IEC 60749-26:2006 ED2