DPS
Drejtoria e Përgjithshme e Standardizimit

0 Produkte

Tel/Cel: +355 4 222 62 55
E-mail: info@dps.gov.al
Adresa: Rr.: "Reshit Collaku", (pranë ILDKPKI, kati VI), Kutia Postare 98, Tiranë - Shqipëri

Main menu

IEC 62418:2010 ED1

Semiconductor devices - Metallization stress void test

Publication date: 22 pri 2010

General information

Current stage: 60.60 Effective date: 22 pri 2010

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht

Buying

Statusi: Publikuar

PDF - 13 003 Lekë

Paper - 13 003 Lekë

CD - 13 003 Lekë

Language

Language in which you want to receive the document.

Scope

IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization.

Life cycle

NOW

PUBLISHED
IEC 62418:2010 ED1
60.60 Standard published
22 pri 2010