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PNW 47E-894 ED1

Semiconductor devices - Part 14-14: Semiconductor sensors - Performance test method for capacitive fingerprint sensors

General information

10.20     3 pri 2026

PRVN    26 qer 2026

IEC

TC 47/SC 47E

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
PNW 47E-894 ED1
10.20 New project ballot initiated
3 pri 2026