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IEC 60747-14-16 ED1

Semiconductor devices - Part 14-16: Semiconductor sensors - Performance test method for capacitive fingerprint sensors

General information

20.99     Jul 31, 2026

CD    Jul 31, 2026

IEC

TC 47/SC 47E

International Standard

31.080.99  

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-16 ED1
20.99 WD approved for registration as CD
Jul 31, 2026