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IEC PAS 62050:2004 ED1

Board level drop test method of components for handheld electronic products
10 nën 2004

General information

99.60     30 jan 2008

IEC

TC 47

Publicly Available Specification

31.080.01  

anglisht  

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Scope

The Board Level Drop Test Method is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface mounted components while duplicating the failure modes normally observed during product level test.
The purpose of this document is to prescribe a standardized test method and reporting procedure.

Life cycle

NOW

WITHDRAWN
IEC PAS 62050:2004 ED1
99.60 Withdrawal effective
30 jan 2008

REVISED BY

WITHDRAWN
IEC 60749-37:2008 ED1