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IEC 60749-22-2 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods

General information

40.99     6 qer 2025

DECFDIS    13 qer 2025

IEC

TC 47

International Standard

31.080.01  

Scope

Life cycle

PREVIOUSLY

PUBLISHED
IEC 60749-22:2002 ED1

NOW

IN_DEVELOPMENT
IEC 60749-22-2 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
6 qer 2025