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IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

30.99     27 mar 2026

TCDV    31 dhj 2026

IEC

TC 47

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63364-2 ED1
30.99 CD approved for registration as DIS
27 mar 2026