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IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

20.99     20 qer 2025

CD    31 korr 2025

IEC

TC 47

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63364-2 ED1
20.99 WD approved for registration as CD
20 qer 2025