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IEC 63364-2 ED1

Semiconductor devices - Semiconductor devices for IoT system - Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

General information

30.20     Oct 31, 2025

PCC    Dec 26, 2025

IEC

TC 47

International Standard

31.080.99  

Life cycle

NOW

IN_DEVELOPMENT
IEC 63364-2 ED1
30.20 CD study/ballot initiated
Oct 31, 2025

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