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IEC 62047-51 ED1

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

General information

50.00     14 gush 2026

CFDIS    6 nën 2026

IEC

TC 47/SC 47F

International Standard

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IN_DEVELOPMENT
IEC 62047-51 ED1
50.00 Final text received or FDIS registered for formal approval
14 gush 2026