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IEC 62047-51 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

General information

Current stage: 30.20 Effective date: 22 nën 2024

Next stage: PCC Next stage date: 14 shk 2025

Originator: IEC

Owner: TC 47/SC 47F

Type: International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-51 ED1
30.20 CD study/ballot initiated
22 nën 2024

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