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IEC 62047-51 ED1

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

General information

40.00     17 tet 2025

CCDV    5 dhj 2025

IEC

TC 47/SC 47F

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-51 ED1
40.00 DIS registered
17 tet 2025