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IEC 62047-51 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

General information

30.99     21 shk 2025

TCDV    25 korr 2025

IEC

TC 47/SC 47F

International Standard

Scope

Life cycle

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IN_DEVELOPMENT
IEC 62047-51 ED1
30.99 CD approved for registration as DIS
21 shk 2025