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IEC 63581-1 ED1

Semiconductor devices - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 1: Classification of defects

General information

40.60     30 jan 2026

IEC

TC 47

International Standard

31.080.99  

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63581-1 ED1
40.60 Close of voting
30 jan 2026