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IEC 63616 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

General information

50.00     18 korr 2025

CFDIS    10 tet 2025

IEC

TC 46/SC 46F

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63616 ED1
50.00 Final text received or FDIS registered for formal approval
18 korr 2025