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IEC 63616

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

General information

30.99     27 sht 2024

TCDV    31 dhj 2024

IEC

TC 46/SC 46F

International Standard

Scope

Life cycle

NOW

IN_DEVELOPMENT
IEC 63616
30.99 CD approved for registration as DIS
27 sht 2024