IEC 63616 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

General information

Current stage: 50.00 Effective date: 18 korr 2025

Next stage: CFDIS Next stage date: 10 tet 2025

Originator: IEC

Owner: TC 46/SC 46F

Type: International Standard

ICS: 17.220.20 29.050

Scope

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Life cycle

NOW

IN_DEVELOPMENT
IEC 63616 ED1
50.00 Final text received or FDIS registered for formal approval
18 korr 2025