IEC 63616:2025 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Publication date: 28 nën 2025

General information

Current stage: 60.60 Effective date: 28 nën 2025

Originator: IEC

Owner: TC 46/SC 46F

Type: International Standard

ICS: 17.220.20 29.050

Gjuha: anglisht frëngjisht

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Statusi: Publikuar

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Scope

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

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PUBLISHED
IEC 63616:2025 ED1
60.60 Standard published
28 nën 2025