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IEC 63616 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

General information

Current stage: 40.20 Effective date: Feb 28, 2025

Next stage: PRVC Next stage date: May 23, 2025

Originator: IEC

Owner: TC 46/SC 46F

Type: International Standard

Life cycle

NOW

IN_DEVELOPMENT
IEC 63616 ED1
40.20 DIS ballot initiated: 12 weeks
Feb 28, 2025

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