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IEC 63616:2025 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

Nov 28, 2025

General information

60.60     Nov 28, 2025

IEC

TC 46/SC 46F

International Standard

17.220.20     29.050  

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IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

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PUBLISHED
IEC 63616:2025 ED1
60.60 Standard published
Nov 28, 2025