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IEC 63616 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies balanced-type circular disk resonator method

General information

50.00     Jul 18, 2025

CFDIS    Oct 10, 2025

IEC

TC 46/SC 46F

International Standard

17.220.20     29.050  

Scope

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Life cycle

NOW

IN_DEVELOPMENT
IEC 63616 ED1
50.00 Final text received or FDIS registered for formal approval
Jul 18, 2025