IEC 60749-7:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Publication date: 9 pri 2002

General information

Current stage: 99.60 Effective date: 17 qer 2011

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht spanjisht

Buying

Statusi: Revised

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

Language

Language in which you want to receive the document.

Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

WITHDRAWN
IEC 60749-7:2002 ED1
99.60 Withdrawal effective
17 qer 2011

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749-7:2002/COR1:2003 ED1

REVISED BY

PUBLISHED
IEC 60749-7:2011 ED2