IEC 60749-7:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Publication date: Apr 9, 2002

General information

Current stage: 99.60 Effective date: Jun 17, 2011

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Languages: English French Spanish

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Status: Revised

PDF - ALL 2,261

Paper - ALL 2,261

CD - ALL 2,261

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Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

WITHDRAWN
IEC 60749-7:2002 ED1
99.60 Withdrawal effective
Jun 17, 2011

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60749-7:2002/COR1:2003 ED1

REVISED BY

PUBLISHED
IEC 60749-7:2011 ED2