IEC 60749-17:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Publication date: 20 shk 2003

General information

Current stage: 99.60 Effective date: 28 mar 2019

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01

Gjuha: anglisht frëngjisht spanjisht

Buying

Statusi: Revised

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60749-17:2003 ED1
99.60 Withdrawal effective
28 mar 2019

REVISED BY

PUBLISHED
IEC 60749-17:2019 ED2