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IEC 60749-17:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Feb 20, 2003

General information

99.60     Mar 28, 2019

WPUB   

IEC

TC 47

International Standard

31.080.01  

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Revised

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60749-17:2003 ED1
99.60 Withdrawal effective
Mar 28, 2019

REVISED BY

PUBLISHED
IEC 60749-17:2019 ED2