Published
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.
WITHDRAWN
IEC 60749-17:2003 ED1
PUBLISHED
IEC 60749-17:2019 ED2
60.60
Standard published
Mar 28, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
60.60 Standard published
Shqip