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IEC PAS 62189:2000 ED1

Bias Life

Publication date: 28 nën 2000

General information

Current stage: 99.60 Effective date: 23 shk 2004

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01

Gjuha: anglisht

Buying

Statusi: Replaced

PDF - 2 261 Lekë

Paper - 2 261 Lekë

CD - 2 261 Lekë

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Scope

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Life cycle

NOW

WITHDRAWN
IEC PAS 62189:2000 ED1
99.60 Withdrawal effective
23 shk 2004

REVISED BY

PUBLISHED
IEC 60749-23:2004 ED1