IEC TS 62607-5-3:2020 ED1

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

Publication date: 14 pri 2020

General information

Current stage: 60.60 Effective date: 14 pri 2020

Originator: IEC

Owner: TC 113

Type: Technical Specification

ICS: 07.030 07.120

Gjuha: anglisht

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Statusi: Publikuar

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Scope

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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PUBLISHED
IEC TS 62607-5-3:2020 ED1
60.60 Standard published
14 pri 2020