IEC TS 62607-5-3:2020 ED1

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

Publication date: Apr 14, 2020

General information

Current stage: 60.60 Effective date: Apr 14, 2020

Originator: IEC

Owner: TC 113

Type: Technical Specification

ICS: 07.030 07.120

Languages: English

Buying

Status: Published

PDF - ALL 13,003

Paper - ALL 13,003

CD - ALL 13,003

Language

Language in which you want to receive the document.

Scope

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

Life cycle

NOW

PUBLISHED
IEC TS 62607-5-3:2020 ED1
60.60 Standard published
Apr 14, 2020