SSH EN 60749-1:2003

Pajisjet gjysmëpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 1: Të përgjithshme

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publication date: 18 dhj 2006

General information

Current stage: 60.60 Effective date: 1 jan 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Publikuar

PDF - 1 963 Lekë

Paper - 1 963 Lekë

CD - 1 963 Lekë

PDF and Paper - 3 926 Lekë

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

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PUBLISHED
SSH EN 60749-1:2003
60.60 Standard published
1 jan 2006

SSH EN 60749-1:2003

Pajisjet gjysmëpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 1: Të përgjithshme

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

General information

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Scope

Life cycle

NOW

Related project

Adopted from EN 60749-1:2003

Adopted from IEC 60749-1 Ed. 1.0 b