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Drejtoria e Përgjithshme e Standardizimit
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prSSH IEC 60749-32:2002/COR1:2003 ED1:2026

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

General information

10.00     7 gush 2026

DPS

DPS/KT 7

International Standard

31.080.01  

Scope

Life cycle

NOW

IN_DEVELOPMENT
prSSH IEC 60749-32:2002/COR1:2003 ED1:2026
10.00 Proposal for new project registered
7 gush 2026

Related project

Adopted from IEC 60749-32:2002/COR1:2003 ED1 IDENTICAL