SSH EN 60749-19:2003/corrigendum Jun. 2003
Pajisje gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 19: Rezistenca ndaj prerjes së stampës
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
22 maj 2026
General information
60.60
22 maj 2026
95.99
DPS
DPS/KT 7
European Norm
31.080.01
anglisht
Scope
Life cycle
NOW
PUBLISHED
SSH EN 60749-19:2003/corrigendum Jun. 2003
60.60
Standard published
22 maj 2026
Related project
Adopted from
EN 60749-19:2003/corrigendum Jun. 2003
IDENTICAL