SSH EN 62415:2010

Pajisje me gjysëmpërçues - Prova e zhvendosjes elektrike në rrymat konstante

Semiconductor devices - Constant current electromigration test

Publication date: 30 nën 2010

General information

Current stage: 60.60 Effective date: 1 jan 2010

Originator: DPS

Owner: DPS/KT 7

Type: European Norm

ICS: 31.080

Gjuha: anglisht

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Statusi: Publikuar

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Scope

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Life cycle

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PUBLISHED
SSH EN 62415:2010
60.60 Standard published
1 jan 2010

Related project

Adopted from EN 62415:2010

Adopted from IEC 62415 Ed. 1.0 b

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