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SSH EN 60749-37:2008

Pajisjet gjysëmpërçuese — Metodat e provës mekanike dhe klimatike — Pjesa 37: Metoda e provës së pikës në letër me përdorim të një akselerometri (matës i nxitimit)

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
16 tet 2008

General information

60.60     1 jan 2008

DPS

DPS/KT 7

European Norm

31.080.01  

anglisht  

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Scope

Provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test.

Life cycle

NOW

PUBLISHED
SSH EN 60749-37:2008
60.60 Standard published
1 jan 2008

REVISED BY

PUBLISHED
SSH EN IEC 60749-37:2022

Related project

Adopted from EN 60749-37:2008

Adopted from IEC 60749-37 Ed. 1.0 b