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SSH EN 60749-30:2005

Pajisjet gjysmëpërçuese — Metodat e provës klimatike dhe mekanike — Pjesa 30: Parakushtet e pajisjeve jo hermetike të montuara në sipërfaqe para provës së sigurisë

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
6 qer 2008
95.99 Withdrawal of Standard   7 maj 2025

General information

95.99     7 maj 2025

DPS

DPS/KT 7

European Norm

31.080.01  

anglisht  

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Scope

Establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation. These SMDs should be subjected to the appropriate preconditioning sequence described in this standard prior to being submitted to specific in-house reliability testing in order to evaluate long term reliability.

Life cycle

NOW

WITHDRAWN
SSH EN 60749-30:2005
95.99 Withdrawal of Standard
7 maj 2025

REVISED BY

IN_DEVELOPMENT
SSH EN IEC 60749-30:2020

Related project

Adopted from EN 60749-30:2005

Adopted from IEC 60749-30 Ed. 1.0 b