SSH EN 60749-31:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 31: Flakshmëria e pajisjeve të mbyllura në plastikë ( e induktuar nga brenda)

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Publication date: 18 dhj 2006

General information

Current stage: 60.60 Effective date: 1 jan 2006

Originator: DPS

Owner: DPS/KT 4

Type: European Norm

ICS: 31.080.01

Gjuha: anglisht

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Statusi: Publikuar

PDF - 1 606 Lekë

Paper - 1 606 Lekë

CD - 1 606 Lekë

PDF and Paper - 3 212 Lekë

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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

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PUBLISHED
SSH EN 60749-31:2003
60.60 Standard published
1 jan 2006

SSH EN 60749-31:2003

Pajisjet gjysëmpërçuese - Metodat e provave mekanike dhe klimatike - Pjesa 31: Flakshmëria e pajisjeve të mbyllura në plastikë ( e induktuar nga brenda)

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

General information

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Scope

Life cycle

NOW

Related project

Adopted from EN 60749-31:2003

Adopted from IEC 60749-31 Ed. 1.0 b