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Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ
20.99 WD approved for registration as CD
Amendment 1 - Live working - Terminology for tools, devices and equipment
50.60 Close of voting. Proof returned by secretariat
Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
50.00 Final text received or FDIS registered for formal approval
Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors
50.00 Final text received or FDIS registered for formal approval
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array
30.60 Close of voting/ comment period
Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
40.99 Full report circulated: DIS approved for registration as FDIS
Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes
50.99 FDIS or proof approved for publication
Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
60.00 Standard under publication
Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
20.99 WD approved for registration as CD
Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
20.99 WD approved for registration as CD
Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
20.99 WD approved for registration as CD
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
40.00 DIS registered
Standard test procedures for semiconductor X-ray energy spectrometers
20.99 WD approved for registration as CD
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements
40.00 DIS registered
Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols
50.00 Final text received or FDIS registered for formal approval
Nuclear facilities - Electrical equipment important to safety - Qualification
30.99 CD approved for registration as DIS
Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry
20.99 WD approved for registration as CD
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