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Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 6: Extreme space weather - Potential impact on the avionics environment and electronics
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 7: Management of single event effects (SEE) analysis process in avionics design
60.60 Standard published
Process management for avionics - Atmospheric radiation effects - Part 8: Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment - Awareness guidelines
60.60 Standard published
Nuclear power plants - Instrumentation and control important to safety - Resistance temperature detectors
60.60 Standard published
Radiation protection instrumentation - Alarming personal radiation devices (PRDs) for the detection of illicit trafficking of radioactive material
60.60 Standard published
High density recording format on CD-R/RW disc systems - HD-BURN format
60.60 Standard published
Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
60.60 Standard published
Semiconductor devices - Constant current electromigration test
60.60 Standard published
Semiconductor devices - Hot carrier test on MOS transistors
60.60 Standard published
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
60.60 Standard published
Control technology - Rules for the designation of measuring instruments
60.60 Standard published
English