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Conductors of insulated cables - Data for AWG and KCMIL sizes
60.60 Standard published
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
60.60 Standard published
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
60.60 Standard published
Multimedia systems and equipment - Multimedia e-publishing and e-books - Interchange format for e-dictionaries
60.60 Standard published
Amendment 1 - General requirements for arc fault detection devices
60.60 Standard published
Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)
60.60 Standard published
Corrigendum 1 - Amendment 2 - General requirements for arc fault detection and protection devices (AFDDs)
60.60 Standard published
Corrigendum 1 - General requirements for arc fault detection devices
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 11-1: Electromagnetic compatibility - Shielding effectiveness of nanomaterials: near-field probe method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-6: Carbon nanotube-related products - Thermal diffusivity of vertically-aligned carbon nanotubes: flash method
60.60 Standard published
Nanomanufacturing - key control characteristics for CNT film applications - Resistivity — Part 2-1:
90.93 Standard confirmed
Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 3-2: Luminescent nanoparticles - Determination of mass of quantum dot dispersion
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)
60.60 Standard published
English